Wikipedia:Picture of the day/May 10, 2005
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A magnification series of a snow crystal using a low temperature scanning electron microscope with magnification up to 100,000X, compared to 30X – 500X available with a light microscopes. Snow samples are very fragile and exposure to the light necessary to photograph them, using light microscopes, can damage the crystals and even melt them. A low temperature SEM operating at -170°C avoids disturbing the structure. Photo credit: USDA Beltsville Agricultural Research Unit |